IB Labs develops and manufactures metrology and failure analysis equipment for companies in growing markets such as semiconductors, nanotechnology, materials science, life science, and interdisciplinary research.

IB Labs’ proprietary Universal Ion Beam (UIB^TM) technology for in-situ planar polishing and imaging has been developed in response to ever challenging metrology and failure analysis needs at the nano-scale. It addresses a wide range of applications, such as site-specific de-layering, etching, in-situ continuous milling and imaging, 2D-to-3D image ‎reconstruction and materials analysis.‎