Welcome to IB Labs
We are a high-tech company in the field of metrology, nano machining and failure analysis of semiconductor devices. IB Labs introduces an entirely new concept of surface preparation for physical and electrical failure analysis and imaging.
IB Labs’ solutions are based on its proprietary Universal Ion Beam (UIBTM) technology for site-specific in-situ ion-milling. Our technology uniquely combines maneuverable broad- and focused ion beams in a single tool, an Integrated Beam Unit (IBU). The IBU is a next-generation Surface Micro-machining tool for Yield Engineering and Failure Analysis. With its open-concept modular design, it is fully customizable. It is configurable as a stand-alone or integrated into existing Scanning Electron Microscopes, Mass- or Raman-spectrometers or other tools.