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Welcome to IB Labs

We are a high-tech company in the field of metrology, nano machining and failure analysis of semiconductor devices. IB Labs introduces an entirely new concept of surface preparation for physical and electrical ‎failure analysis and imaging.

IB Labs’ solutions are based on its proprietary Universal Ion Beam (UIBTM) technology for site-specific in-situ ion-milling. Our technology uniquely combines maneuverable broad- and focused ion beams in a single tool, an Integrated Beam Unit (IBU). The IBU is a next-generation Surface ‎Micro-machining tool for Yield Engineering and Failure Analysis. With its open-concept modular ‎design, it is fully customizable. It is configurable as a stand-alone or integrated into existing ‎Scanning Electron Microscopes, Mass- or Raman-spectrometers or other tools.‎

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